1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
|
/* SPDX-License-Identifier: GPL-2.0+ */
/*
* Copyright (c) 2013 Google, Inc.
*/
#ifndef __TEST_TEST_H
#define __TEST_TEST_H
#include <malloc.h>
#include <linux/bitops.h>
/*
* struct unit_test_state - Entire state of test system
*
* @fail_count: Number of tests that failed
* @start: Store the starting mallinfo when doing leak test
* @of_live: true to use livetree if available, false to use flattree
* @of_root: Record of the livetree root node (used for setting up tests)
* @root: Root device
* @testdev: Test device
* @force_fail_alloc: Force all memory allocs to fail
* @skip_post_probe: Skip uclass post-probe processing
* @fdt_chksum: crc8 of the device tree contents
* @fdt_copy: Copy of the device tree
* @fdt_size: Size of the device-tree copy
* @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
* @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
* @runs_per_test: Number of times to run each test (typically 1)
* @expect_str: Temporary string used to hold expected string value
* @actual_str: Temporary string used to hold actual string value
*/
struct unit_test_state {
int fail_count;
struct mallinfo start;
struct device_node *of_root;
bool of_live;
struct udevice *root;
struct udevice *testdev;
int force_fail_alloc;
int skip_post_probe;
uint fdt_chksum;
void *fdt_copy;
uint fdt_size;
void *other_fdt;
int other_fdt_size;
int runs_per_test;
char expect_str[512];
char actual_str[512];
};
/* Test flags for each test */
enum {
UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
/* do extra driver model init and uninit */
UT_TESTF_DM = BIT(6),
};
/**
* struct unit_test - Information about a unit test
*
* @name: Name of test
* @func: Function to call to perform test
* @flags: Flags indicated pre-conditions for test
*/
struct unit_test {
const char *file;
const char *name;
int (*func)(struct unit_test_state *state);
int flags;
};
/**
* UNIT_TEST() - create linker generated list entry for unit a unit test
*
* The macro UNIT_TEST() is used to create a linker generated list entry. These
* list entries are enumerate tests that can be execute using the ut command.
* The list entries are used both by the implementation of the ut command as
* well as in a related Python test.
*
* For Python testing the subtests are collected in Python function
* generate_ut_subtest() by applying a regular expression to the lines of file
* u-boot.sym. The list entries have to follow strict naming conventions to be
* matched by the expression.
*
* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
* foo that can be executed via command 'ut foo bar' and is implemented in
* function foo_test_bar().
*
* @_name: concatenation of name of the test suite, "_test_", and the name
* of the test
* @_flags: an integer field that can be evaluated by the test suite
* implementation
* @_suite: name of the test suite concatenated with "_test"
*/
#define UNIT_TEST(_name, _flags, _suite) \
ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
.file = __FILE__, \
.name = #_name, \
.flags = _flags, \
.func = _name, \
}
/* Get the start of a list of unit tests for a particular suite */
#define UNIT_TEST_SUITE_START(_suite) \
ll_entry_start(struct unit_test, ut_ ## _suite)
#define UNIT_TEST_SUITE_COUNT(_suite) \
ll_entry_count(struct unit_test, ut_ ## _suite)
/* Use ! and ~ so that all tests will be sorted between these two values */
#define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
#define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
#define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
/* Sizes for devres tests */
enum {
TEST_DEVRES_SIZE = 100,
TEST_DEVRES_COUNT = 10,
TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
/* A few different sizes */
TEST_DEVRES_SIZE2 = 15,
TEST_DEVRES_SIZE3 = 37,
};
/**
* testbus_get_clear_removed() - Test function to obtain removed device
*
* This is used in testbus to find out which device was removed. Calling this
* function returns a pointer to the device and then clears it back to NULL, so
* that a future test can check it.
*/
struct udevice *testbus_get_clear_removed(void);
#ifdef CONFIG_SANDBOX
#include <asm/state.h>
#include <asm/test.h>
#endif
static inline void arch_reset_for_test(void)
{
#ifdef CONFIG_SANDBOX
state_reset_for_test(state_get_current());
#endif
}
static inline int test_load_other_fdt(struct unit_test_state *uts)
{
int ret = 0;
#ifdef CONFIG_SANDBOX
ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
#endif
return ret;
}
#endif /* __TEST_TEST_H */
|
