Age | Commit message (Expand) | Author |
---|---|---|
2014-12-11 | dm: i2c: Add tests for I2C | Simon Glass |
2014-10-22 | dm: sf: Add tests for SPI flash | Simon Glass |
2014-10-22 | dm: spi: Add tests | Simon Glass |
2014-07-23 | dm: Provide a function to scan child FDT nodes | Simon Glass |
2014-06-20 | dm: Allow driver model tests only for sandbox | Simon Glass |
2014-03-04 | dm: Add a 'dm' command for testing | Simon Glass |
2014-03-04 | dm: Add basic tests | Simon Glass |