1 files changed, 61 insertions, 4 deletions

diff --git a/test/dm/of_platdata.c b/test/dm/of_platdata.c
index 0463cf0b433..ec41087a558 100644
--- a/test/dm/of_platdata.c
+++ b/test/dm/of_platdata.c
@@ -1,11 +1,14 @@
 // SPDX-License-Identifier: GPL-2.0+
 
 #include <common.h>
+#include <clk.h>
 #include <dm.h>
 #include <dt-structs.h>
+#include <irq.h>
 #include <dm/test.h>
 #include <test/test.h>
 #include <test/ut.h>
+#include <asm-generic/gpio.h>
 #include <asm/global_data.h>
 
 /* Test that we can find a device using of-platdata */
@@ -27,11 +30,9 @@ static int dm_test_of_plat_props(struct unit_test_state *uts)
 	struct udevice *dev;
 	int i;
 
-	/* Skip the clock */
-	ut_assertok(uclass_first_device_err(UCLASS_MISC, &dev));
-	ut_asserteq_str("sandbox_clk_test", dev->name);
+	ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "sandbox_spl_test",
+					      &dev));
 
-	ut_assertok(uclass_next_device_err(&dev));
 	plat = dev_get_plat(dev);
 	ut_assert(plat->boolval);
 	ut_asserteq(1, plat->intval);
@@ -222,3 +223,59 @@ static int dm_test_of_plat_parent(struct unit_test_state *uts)
 }
 DM_TEST(dm_test_of_plat_parent, UT_TESTF_SCAN_PDATA);
 #endif
+
+/* Test clocks with of-platdata */
+static int dm_test_of_plat_clk(struct unit_test_state *uts)
+{
+	struct dtd_sandbox_clk_test *plat;
+	struct udevice *dev;
+	struct clk clk;
+
+	ut_assertok(uclass_first_device_err(UCLASS_MISC, &dev));
+	ut_asserteq_str("sandbox_clk_test", dev->name);
+	plat = dev_get_plat(dev);
+
+	ut_assertok(clk_get_by_phandle(dev, &plat->clocks[0], &clk));
+	ut_asserteq_str("sandbox_fixed_clock", clk.dev->name);
+
+	return 0;
+}
+DM_TEST(dm_test_of_plat_clk, UT_TESTF_SCAN_PDATA);
+
+/* Test irqs with of-platdata */
+static int dm_test_of_plat_irq(struct unit_test_state *uts)
+{
+	struct dtd_sandbox_irq_test *plat;
+	struct udevice *dev;
+	struct irq irq;
+
+	ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "sandbox_irq_test",
+					      &dev));
+	plat = dev_get_plat(dev);
+
+	ut_assertok(irq_get_by_phandle(dev, &plat->interrupts_extended[0],
+				       &irq));
+	ut_asserteq_str("sandbox_irq", irq.dev->name);
+
+	return 0;
+}
+DM_TEST(dm_test_of_plat_irq, UT_TESTF_SCAN_PDATA);
+
+/* Test GPIOs with of-platdata */
+static int dm_test_of_plat_gpio(struct unit_test_state *uts)
+{
+	struct dtd_sandbox_gpio_test *plat;
+	struct udevice *dev;
+	struct gpio_desc desc;
+
+	ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "sandbox_gpio_test",
+					      &dev));
+	plat = dev_get_plat(dev);
+
+	ut_assertok(gpio_request_by_phandle(dev, &plat->test_gpios[0], &desc,
+					    GPIOD_IS_OUT));
+	ut_asserteq_str("sandbox_gpio", desc.dev->name);
+
+	return 0;
+}
+DM_TEST(dm_test_of_plat_gpio, UT_TESTF_SCAN_PDATA);