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authorStephen Warren <swarren@nvidia.com>2016-01-27 23:57:46 -0700
committerSimon Glass <sjg@chromium.org>2016-01-28 21:01:24 -0700
commit26e1beccbeb82ce7a4713ad899eb34b795228891 (patch)
tree8bcbfeb8acc6eb186a52e1967d965df58bbcc894 /test
parentd20e5e976f70bd2e230787091a88278dfe6e5192 (diff)
test/dm: clear unit test failure count each run
The ut command prints a test failure count each time it is executed. This is stored in a global variable which is never reset. Consequently, the printed failure count accumulates across runs. Fix this by clearing the counter each time "ut" is invoked. Signed-off-by: Stephen Warren <swarren@nvidia.com> Acked-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test')
-rw-r--r--test/dm/test-main.c2
1 files changed, 2 insertions, 0 deletions
diff --git a/test/dm/test-main.c b/test/dm/test-main.c
index 91bdda83ab3..f2e00481438 100644
--- a/test/dm/test-main.c
+++ b/test/dm/test-main.c
@@ -81,6 +81,8 @@ static int dm_test_main(const char *test_name)
struct unit_test *test;
int run_count;
+ uts->fail_count = 0;
+
/*
* If we have no device tree, or it only has a root node, then these
* tests clearly aren't going to work...