summaryrefslogtreecommitdiff
path: root/test
diff options
context:
space:
mode:
authorFabrice Gasnier <fabrice.gasnier@st.com>2018-11-12 14:03:58 +0100
committerTom Rini <trini@konsulko.com>2018-11-20 12:35:25 -0500
commit63f004e7aae17a6b6048c88ce7e39d64e58c08c1 (patch)
treed24d457dd1dfedb302da045a978782508556dcc1 /test
parentd73d81fd85e4a030ade42c4b2d13466d45090aa3 (diff)
dm: adc: add uclass's mask and conversion helpers
Add two functions to ADC uclass's: - adc_raw_to_uV() to ease ADC raw value conversion to microvolts - adc_channel_mask() to get channels on consumer side Signed-off-by: Fabrice Gasnier <fabrice.gasnier@st.com> Reviewed-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test')
-rw-r--r--test/dm/adc.c35
1 files changed, 35 insertions, 0 deletions
diff --git a/test/dm/adc.c b/test/dm/adc.c
index 13eda3bd23..1f82304f41 100644
--- a/test/dm/adc.c
+++ b/test/dm/adc.c
@@ -22,10 +22,14 @@
static int dm_test_adc_bind(struct unit_test_state *uts)
{
struct udevice *dev;
+ unsigned int channel_mask;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
+ ut_assertok(adc_channel_mask(dev, &channel_mask));
+ ut_asserteq((1 << SANDBOX_ADC_CHANNELS) - 1, channel_mask);
+
return 0;
}
DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT);
@@ -160,3 +164,34 @@ static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
return 0;
}
DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT);
+
+static const int dm_test_adc_uV_data[SANDBOX_ADC_CHANNELS] = {
+ ((u64)SANDBOX_ADC_CHANNEL0_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
+ SANDBOX_ADC_DATA_MASK,
+ ((u64)SANDBOX_ADC_CHANNEL1_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
+ SANDBOX_ADC_DATA_MASK,
+ ((u64)SANDBOX_ADC_CHANNEL2_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
+ SANDBOX_ADC_DATA_MASK,
+ ((u64)SANDBOX_ADC_CHANNEL3_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
+ SANDBOX_ADC_DATA_MASK,
+};
+
+static int dm_test_adc_raw_to_uV(struct unit_test_state *uts)
+{
+ struct adc_channel *tdata = adc_channel_test_data;
+ unsigned int i, data;
+ struct udevice *dev;
+ int uV;
+
+ ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
+ /* Test each ADC channel's value in microvolts */
+ for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
+ ut_assertok(adc_start_channel(dev, tdata->id));
+ ut_assertok(adc_channel_data(dev, tdata->id, &data));
+ ut_assertok(adc_raw_to_uV(dev, data, &uV));
+ ut_asserteq(dm_test_adc_uV_data[i], uV);
+ }
+
+ return 0;
+}
+DM_TEST(dm_test_adc_raw_to_uV, DM_TESTF_SCAN_FDT);