Merge git://git.denx.de/u-boot-dm

1 files changed, 43 insertions, 0 deletions

diff --git a/test/dm/sf.c b/test/dm/sf.c
new file mode 100644
index 0000000000..57dd1345c4
--- /dev/null
+++ b/test/dm/sf.c
@@ -0,0 +1,43 @@
+/*
+ * Copyright (C) 2013 Google, Inc
+ *
+ * SPDX-License-Identifier:	GPL-2.0+
+ */
+
+#include <common.h>
+#include <dm.h>
+#include <fdtdec.h>
+#include <spi.h>
+#include <spi_flash.h>
+#include <asm/state.h>
+#include <dm/ut.h>
+#include <dm/test.h>
+#include <dm/util.h>
+
+/* Test that sandbox SPI flash works correctly */
+static int dm_test_spi_flash(struct dm_test_state *dms)
+{
+	/*
+	 * Create an empty test file and run the SPI flash tests. This is a
+	 * long way from being a unit test, but it does test SPI device and
+	 * emulator binding, probing, the SPI flash emulator including
+	 * device tree decoding, plus the file-based backing store of SPI.
+	 *
+	 * More targeted tests could be created to perform the above steps
+	 * one at a time. This might not increase test coverage much, but
+	 * it would make bugs easier to find. It's not clear whether the
+	 * benefit is worth the extra complexity.
+	 */
+	ut_asserteq(0, run_command_list(
+		"sb save hostfs - spi.bin 0 200000;"
+		"sf probe;"
+		"sf test 0 10000", -1,  0));
+	/*
+	 * Since we are about to destroy all devices, we must tell sandbox
+	 * to forget the emulation device
+	 */
+	sandbox_sf_unbind_emul(state_get_current(), 0, 0);
+
+	return 0;
+}
+DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);