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authorPrzemyslaw Marczak <p.marczak@samsung.com>2015-04-15 13:07:19 +0200
committerSimon Glass <sjg@chromium.org>2015-04-22 11:03:14 -0600
commit754e71e850cb09d53543846fbed74cc5a1491c76 (patch)
tree8585ba7e94c7ccdac4bc47e1b26a2ce6cda77048 /include/dm/test.h
parent5eaed880282480a5a0a2b555c5f98a11252ed94e (diff)
dm: test: Add tests for device's uclass platform data
This test introduces new test structure type:dm_test_perdev_uc_pdata. The structure consists of three int values only. For the test purposes, three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1. This commit adds two test cases for uclass platform data: - Test: dm_test_autobind_uclass_pdata_alloc - this tests if: * uclass driver sets: .per_device_platdata_auto_alloc_size field * the devices's: dev->uclass_platdata is non-NULL - Test: dm_test_autobind_uclass_pdata_valid - this tests: * if the devices's: dev->uclass_platdata is non-NULL * the structure of type 'dm_test_perdev_uc_pdata' allocated at address pointed by dev->uclass_platdata. Each structure field, should be equal to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1. Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Acked-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'include/dm/test.h')
-rw-r--r--include/dm/test.h20
1 files changed, 20 insertions, 0 deletions
diff --git a/include/dm/test.h b/include/dm/test.h
index 9c4b8d3e57..f03fbcb1cd 100644
--- a/include/dm/test.h
+++ b/include/dm/test.h
@@ -98,6 +98,26 @@ struct dm_test_parent_data {
int flag;
};
+/* Test values for test device's uclass platform data */
+enum {
+ TEST_UC_PDATA_INTVAL1 = 2,
+ TEST_UC_PDATA_INTVAL2 = 334,
+ TEST_UC_PDATA_INTVAL3 = 789452,
+};
+
+/**
+ * struct dm_test_uclass_platda - uclass's information on each device
+ *
+ * @intval1: set to TEST_UC_PDATA_INTVAL1 in .post_bind method of test uclass
+ * @intval2: set to TEST_UC_PDATA_INTVAL2 in .post_bind method of test uclass
+ * @intval3: set to TEST_UC_PDATA_INTVAL3 in .post_bind method of test uclass
+ */
+struct dm_test_perdev_uc_pdata {
+ int intval1;
+ int intval2;
+ int intval3;
+};
+
/*
* Operation counts for the test driver, used to check that each method is
* called correctly