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authorMasahiro Yamada <yamada.m@jp.panasonic.com>2014-12-26 22:20:57 +0900
committerStefan Agner <stefan@agner.ch>2015-04-01 09:01:33 +0200
commiteed5255d6cca9afc6f90d770c40256ff3a0ee117 (patch)
tree8763f4f02025d548611881faae80f9679244bc56 /drivers/mtd/nand/nand_util.c
parent26d64d613123c4b2ebf496d317561ce54675e16a (diff)
mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again
Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning) broke NAND_BBT_USE_FLASH feature. Its git-log claimed that it reinstated the change as by commit fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved "chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);". It causes recursion if scan_bbt does not find a flash based BBT and tries to write one, and the attempt to erase the BBT area causes a bad block check. Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to calling scan_bbt.). Signed-off-by: Masahiro Yamada <yamada.m@jp.panasonic.com> Cc: Rostislav Lisovy <lisovy@merica.cz> Cc: Heiko Schocher <hs@denx.de> Cc: Scott Wood <scottwood@freescale.com>
Diffstat (limited to 'drivers/mtd/nand/nand_util.c')
0 files changed, 0 insertions, 0 deletions